Uysal, Bengü ÖzuğurPekcan, Önder2019-06-272019-06-27201820587-42461898-794X0587-42461898-794Xhttps://hdl.handle.net/20.500.12469/1059Nanostructured silica films using a simple and effective sol-gel spin coating technique were synthesized and the influence of ammonia/sol ratios on the particle size and thickness of this film was investigated. In addition fractal dimensions of the prepared films were determined using the scattering response technique. The samples were characterized by atomic force microscopy and UV-vis spectroscopy. Comparing optical method and image analysis of atomic force microscopy micrographs the fractal dimension of silica nanoparticled thin films was determined. The fractal dimensions of the films verified by atomic force microscopy analysis were found to be around 2.03 which is very close to the values (2.0358 2.0325 and 2.0335) obtained using optical method. As a result of these findings precise determination of the nanoparticled silica thin films fractal dimension using both optical and surface analysis methods was realized.eninfo:eu-repo/semantics/openAccessArticle116011645133WOS:00043660310000810.12693/APhysPolA.133.11602-s2.0-85049605246N/AQ4