Ghodsi, Farhad E.Tepehan, Fatma ZehraTepehan, Galip Gültekin2019-06-272019-06-272008280927-02480927-0248https://hdl.handle.net/20.500.12469/1158https://doi.org/10.1016/j.solmat.2007.02.026CeO2-TiO2-ZrO2 thin films were prepared using the sol-gel process and deposited on glass and ITO-coated glass substrates via dipcoating technique. The samples were heat treated between 100 and 500 degrees C. The heat treatment effects on the electrochromic performances of the films were determined by means of cyclic voltammetry measurements. The structural behavior of the film was characterized by atomic force microscopy and X-ray diffraction. Refractive index extinction coefficient and thickness of the films were determined in the 350-1000nm wavelength using nkd spectrophotometry analysis. Heat treatment temperature affects the electrochromic optical and structural properties of the film. The charge density of the samples increased from 8.8 to 14.8 mC/cm(2) with increasing heat-treatment temperatures from 100 to 500 degrees C. It was determined that the highest ratio between anodic and cathodic charge takes place with increase of temperature up to 500 degrees C. (c) 2007 Elsevier B.V. All rights reserved.eninfo:eu-repo/semantics/openAccessElectrochromismHeat treatmentSol-gelCeO2-TiO2-ZrO2 thin filmsArticle234239292WOS:00025182980002510.1016/j.solmat.2007.02.0262-s2.0-36148977613Q1Q1