Near-Infrared Triggered Degradation for Transient Electronics

dc.authorid0000-0003-4700-7050en_US
dc.authorscopusid57200181969en_US
dc.authorwosidJGM-0202-2023en_US
dc.contributor.authorEmin İstif, Mohsin Ali, Elif Yaren Özüaçıksöz, Yağız Morova, Levent Beker
dc.date.accessioned2024-01-05T13:20:00Z
dc.date.available2024-01-05T13:20:00Z
dc.date.issued2024en_US
dc.departmentFakülteler, Mühendislik ve Doğa Bilimleri Fakültesi, Moleküler Biyoloji ve Genetik Bölümüen_US
dc.description.abstractElectronics that disintegrate after stable operation present exciting opportunities for niche medical implant and consumer electronics applications. The disintegration of these devices can be initiated due to their medium conditions or triggered by external stimuli, which enables on-demand transition. An external stimulation method that can penetrate deep inside the body could revolutionize the use of transient electronics as implantable medical devices (IMDs), eliminating the need for secondary surgery to remove the IMDs. We report near-infrared (NIR) light-triggered transition of metastable cyclic poly(phthalaldehyde) (cPPA) polymers. The transition of the encapsulation layer is achieved through the conversion of NIR light to heat, facilitated by bioresorbable metals, such as molybdenum (Mo). We reported a rapid degradation of cPPA encapsulation layer about 1 min, and the rate of degradation can be controlled by laser power and exposure time. This study offers a new approach for light triggerable transient electronics for IMDs due to the deep penetration depth of NIR light through to organs and tissues.en_US
dc.identifier.citation0
dc.identifier.doi10.1021/acsomega.3c07203en_US
dc.identifier.urihttps://hdl.handle.net/20.500.12469/5637
dc.institutionauthorİstif, Emin
dc.language.isoenen_US
dc.publisherAmerican Chemical Societyen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.titleNear-Infrared Triggered Degradation for Transient Electronicsen_US
dc.typeArticleen_US
dspace.entity.typePublication

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