Near-Infrared Triggered Degradation for Transient Electronics

dc.authorid 0000-0003-4700-7050 en_US
dc.authorscopusid 57200181969 en_US
dc.authorwosid JGM-0202-2023 en_US
dc.contributor.author Emin İstif, Mohsin Ali, Elif Yaren Özüaçıksöz, Yağız Morova, Levent Beker
dc.date.accessioned 2024-01-05T13:20:00Z
dc.date.available 2024-01-05T13:20:00Z
dc.date.issued 2024 en_US
dc.department Fakülteler, Mühendislik ve Doğa Bilimleri Fakültesi, Moleküler Biyoloji ve Genetik Bölümü en_US
dc.description.abstract Electronics that disintegrate after stable operation present exciting opportunities for niche medical implant and consumer electronics applications. The disintegration of these devices can be initiated due to their medium conditions or triggered by external stimuli, which enables on-demand transition. An external stimulation method that can penetrate deep inside the body could revolutionize the use of transient electronics as implantable medical devices (IMDs), eliminating the need for secondary surgery to remove the IMDs. We report near-infrared (NIR) light-triggered transition of metastable cyclic poly(phthalaldehyde) (cPPA) polymers. The transition of the encapsulation layer is achieved through the conversion of NIR light to heat, facilitated by bioresorbable metals, such as molybdenum (Mo). We reported a rapid degradation of cPPA encapsulation layer about 1 min, and the rate of degradation can be controlled by laser power and exposure time. This study offers a new approach for light triggerable transient electronics for IMDs due to the deep penetration depth of NIR light through to organs and tissues. en_US
dc.identifier.citationcount 0
dc.identifier.doi 10.1021/acsomega.3c07203 en_US
dc.identifier.uri https://hdl.handle.net/20.500.12469/5637
dc.institutionauthor İstif, Emin
dc.language.iso en en_US
dc.publisher American Chemical Society en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.title Near-Infrared Triggered Degradation for Transient Electronics en_US
dc.type Article en_US
dspace.entity.type Publication

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