Atomic force microscopy and spectroscopy studies of annealed Ce/Ti/Zr mixed oxide thin films prepared by sol-gel process

dc.contributor.authorGhodsi, Farhad E.
dc.contributor.authorTepehan, Fatma Zehra
dc.contributor.authorTepehan, Galip Gültekin
dc.date.accessioned2019-06-27T08:06:42Z
dc.date.available2019-06-27T08:06:42Z
dc.date.issued2006
dc.departmentFakülteler, Fen - Edebiyat Fakültesi, İstatistik ve Bilgisayar Bilimleri Bölümüen_US
dc.description.abstractMixed Ce/Ti/Zr oxide thin films with a molar ratio of 0.5:0.25:0.25 were prepared using the sol-gel process and deposited on glass substrates by the dip coating technique. The effect of heat treatment temperature on surface morphology of the films was examined by atomic force microscopy AFM. The optical transmittance and reflectance of the films were measured over the spectral range from 350 to 1000 nm. The refractive index and extinction coefficient and thickness of the films were determined as a function of the heat treatment temperature. The refractive index increased from 1.51 to 2.02 at lambda = 600 nm and the extinction coefficient values increased from 0.006 to 0.094 while the thickness of the films decreased from 81 nm to 45 nm when annealing temperature increased from 100 degrees C to 500 degrees C. The results show that the optical properties and surface morphology of the mixed Cc/Ti/Zr oxide thin films were affected by annealing temperature. (c) 2006 Elsevier B.V. All rights reserved.en_US]
dc.identifier.citation4
dc.identifier.doi10.1016/j.susc.2006.02.078en_US
dc.identifier.endpage4364
dc.identifier.issn0039-6028en_US
dc.identifier.issn0039-6028
dc.identifier.issue18
dc.identifier.scopus2-s2.0-33749130879en_US
dc.identifier.scopusqualityQ3
dc.identifier.startpage4361en_US
dc.identifier.urihttps://hdl.handle.net/20.500.12469/1222
dc.identifier.urihttps://doi.org/10.1016/j.susc.2006.02.078
dc.identifier.volume600en_US
dc.identifier.wosWOS:000241450600170en_US
dc.identifier.wosqualityN/A
dc.institutionauthorTepehan, Galip Gültekinen_US
dc.language.isoenen_US
dc.publisherElsevier Science Bven_US
dc.relation.journalSurface Scienceen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectAFMen_US
dc.subjectnkd spectroscopyen_US
dc.subjectSol-gelen_US
dc.subjectThin filmsen_US
dc.titleAtomic force microscopy and spectroscopy studies of annealed Ce/Ti/Zr mixed oxide thin films prepared by sol-gel processen_US
dc.typeArticleen_US
dspace.entity.typePublication

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Atomic force microscopy and spectroscopy studies of annealed Ce-Ti-Zr mixed oxide thin films prepared by sol-gel process.pdf
Size:
285.22 KB
Format:
Adobe Portable Document Format
Description: