Preparation and characterization of self-assembled thin film of MPS-capped ZnS quantum dots for optical applications

dc.contributor.authorKoç, Kenan
dc.contributor.authorTepehan, Fatma Zehra
dc.contributor.authorTepehan, Galip Gültekin
dc.date.accessioned2019-06-27T08:04:18Z
dc.date.available2019-06-27T08:04:18Z
dc.date.issued2012
dc.departmentFakülteler, Mühendislik ve Doğa Bilimleri Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.description.abstractFor this study we prepared colloidal ZnS quantum dots using 3-mercaptopropyltrimethoxysilane (MPS) as the capping agent. Colloidal ZnS quantum dots were directly deposited on glass substrates by a spin coating process. Therefore self-assembled films made of ZnS quantum dots in a SiO2 network were obtained using only one production step. The films were heat-treated at 100 degrees 125 degrees 150 degrees 175 degrees and 200 degrees C in an N-2 atmosphere. The results showed that the dimension of quantum dots changed from 2.8 nm to 3.2 nm by heat treatment. The refractive index extinction coefficient thickness and dielectric coefficient values of the films were calculated. The present study showed that size and the refractive indices of films can be controlled by the heat treatment. Therefore such films can be a good candidate in optical filter applications.en_US]
dc.identifier.citation8
dc.identifier.doi10.1155/2012/571315en_US
dc.identifier.issn1687-4110en_US
dc.identifier.issn1687-4110
dc.identifier.scopus2-s2.0-84870202691en_US
dc.identifier.scopusqualityN/A
dc.identifier.urihttps://hdl.handle.net/20.500.12469/921
dc.identifier.urihttps://doi.org/10.1155/2012/571315
dc.identifier.wosWOS:000311172100001en_US
dc.identifier.wosqualityN/A
dc.institutionauthorTepehan, Galip Gültekinen_US
dc.language.isoenen_US
dc.publisherHindawi Publishing Corporationen_US
dc.relation.journalJournal of Nanomaterialsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.titlePreparation and characterization of self-assembled thin film of MPS-capped ZnS quantum dots for optical applicationsen_US
dc.typeArticleen_US
dspace.entity.typePublication

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