Preparation and Characterization of Self-Assembled Thin Film of Mps-Capped Zns Quantum Dots for Optical Applications

dc.contributor.author Koç, Kenan
dc.contributor.author Tepehan, Fatma Zehra
dc.contributor.author Tepehan, Galip Gültekin
dc.date.accessioned 2019-06-27T08:04:18Z
dc.date.available 2019-06-27T08:04:18Z
dc.date.issued 2012
dc.department Fakülteler, Mühendislik ve Doğa Bilimleri Fakültesi, Bilgisayar Mühendisliği Bölümü en_US
dc.description.abstract For this study we prepared colloidal ZnS quantum dots using 3-mercaptopropyltrimethoxysilane (MPS) as the capping agent. Colloidal ZnS quantum dots were directly deposited on glass substrates by a spin coating process. Therefore self-assembled films made of ZnS quantum dots in a SiO2 network were obtained using only one production step. The films were heat-treated at 100 degrees 125 degrees 150 degrees 175 degrees and 200 degrees C in an N-2 atmosphere. The results showed that the dimension of quantum dots changed from 2.8 nm to 3.2 nm by heat treatment. The refractive index extinction coefficient thickness and dielectric coefficient values of the films were calculated. The present study showed that size and the refractive indices of films can be controlled by the heat treatment. Therefore such films can be a good candidate in optical filter applications. en_US]
dc.identifier.citationcount 8
dc.identifier.doi 10.1155/2012/571315 en_US
dc.identifier.issn 1687-4110 en_US
dc.identifier.issn 1687-4110
dc.identifier.scopus 2-s2.0-84870202691 en_US
dc.identifier.uri https://hdl.handle.net/20.500.12469/921
dc.identifier.uri https://doi.org/10.1155/2012/571315
dc.identifier.wos WOS:000311172100001 en_US
dc.institutionauthor Tepehan, Galip Gültekin en_US
dc.language.iso en en_US
dc.publisher Hindawi Publishing Corporation en_US
dc.relation.journal Journal of Nanomaterials en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.scopus.citedbyCount 9
dc.title Preparation and Characterization of Self-Assembled Thin Film of Mps-Capped Zns Quantum Dots for Optical Applications en_US
dc.type Article en_US
dc.wos.citedbyCount 8
dspace.entity.type Publication

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