Near-Infrared Triggered Degradation for Transient Electronics
dc.authorid | Istif, Emin/0000-0003-4700-7050 | |
dc.authorid | Bathaei, Yaren/0009-0000-9094-3819 | |
dc.authorid | ali, Mohsin/0000-0001-8626-6122 | |
dc.authorscopusid | 57200181969 | |
dc.authorscopusid | 58267172300 | |
dc.authorscopusid | 58260731800 | |
dc.authorscopusid | 55734551300 | |
dc.authorscopusid | 54975390000 | |
dc.authorwosid | Beker, Levent/AAX-3281-2020 | |
dc.authorwosid | Istif, Emin/JGM-0202-2023 | |
dc.authorwosid | Ali, Mohsin/AEF-1217-2022 | |
dc.contributor.author | Istıf, Emın | |
dc.contributor.author | Ali, Mohsin | |
dc.contributor.author | Ozuaciksoz, Elif Yaren | |
dc.contributor.author | Morova, Yagiz | |
dc.contributor.author | Beker, Levent | |
dc.date.accessioned | 2024-10-15T19:40:46Z | |
dc.date.available | 2024-10-15T19:40:46Z | |
dc.date.issued | 2024 | |
dc.department | Kadir Has University | en_US |
dc.department-temp | [Istif, Emin] Kadir Has Univ, Fac Engn & Nat Sci, Dept Mol Biol & Genet, TR-34083 Istanbul, Turkiye; [Ali, Mohsin; Ozuaciksoz, Elif Yaren] Koc Univ, Dept Biomed Sci & Engn, TR-34450 Istanbul, Turkiye; [Morova, Yagiz] Koc Univ, Surface Sci & Technol Ctr KUYTAM, TR-34450 Istanbul, Turkiye; [Beker, Levent] Koc Univ, Dept Mech Engn, TR-34450 Istanbul, Turkiye; [Beker, Levent] Koc Univ, Nanofabricat & Nanocharacterizat Ctr Sci & Technol, TR-34450 Istanbul, Turkiye | en_US |
dc.description | Istif, Emin/0000-0003-4700-7050; Bathaei, Yaren/0009-0000-9094-3819; ali, Mohsin/0000-0001-8626-6122 | en_US |
dc.description.abstract | Electronics that disintegrate after stable operation present exciting opportunities for niche medical implant and consumer electronics applications. The disintegration of these devices can be initiated due to their medium conditions or triggered by external stimuli, which enables on-demand transition. An external stimulation method that can penetrate deep inside the body could revolutionize the use of transient electronics as implantable medical devices (IMDs), eliminating the need for secondary surgery to remove the IMDs. We report near-infrared (NIR) light-triggered transition of metastable cyclic poly-(phthalaldehyde) (cPPA) polymers. The transition of the encapsulation layer is achieved through the conversion of NIR light to heat, facilitated by bioresorbable metals, such as molybdenum (Mo). We reported a rapid degradation of cPPA encapsulation layer about 1 min, and the rate of degradation can be controlled by laser power and exposure time. This study offers a new approach for light triggerable transient electronics for IMDs due to the deep penetration depth of NIR light through to organs and tissues. | en_US |
dc.description.sponsorship | European Research Council [118C295]; European Research Council [101043119]; Scientific and Technological Research Council of Turkey (TUBITAK) [121Z184]; TUBITAK [121Z184, 3501]; Koc University Surface Science and Technology Center (KUYTAM); European Research Council (ERC) [101043119] Funding Source: European Research Council (ERC) | en_US |
dc.description.sponsorship | L.B. acknowledges TUBITAK 2232 (grant no. 118C295) and the European Research Council (grant no. 101043119). E.I. acknowledges support through the Scientific and Technological Research Council of Turkey (TUBITAK) 3501 (grant no. 121Z184). E.Y.O. is supported by TUBITAK through the 3501 (grant no. 121Z184) program. We acknowledge Koc University Surface Science and Technology Center (KUYTAM) and Koc University Nanofabrication and Nanocharacterization Center (n2STAR) for access to the infrastructure. | en_US |
dc.description.woscitationindex | Science Citation Index Expanded | |
dc.identifier.citation | 0 | |
dc.identifier.doi | 10.1021/acsomega.3c07203 | |
dc.identifier.endpage | 2535 | en_US |
dc.identifier.issn | 2470-1343 | |
dc.identifier.issue | 2 | en_US |
dc.identifier.pmid | 38250408 | |
dc.identifier.scopus | 2-s2.0-85182002777 | |
dc.identifier.scopusquality | Q2 | |
dc.identifier.startpage | 2528 | en_US |
dc.identifier.uri | https://doi.org/10.1021/acsomega.3c07203 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12469/6392 | |
dc.identifier.volume | 9 | en_US |
dc.identifier.wos | WOS:001144008200001 | |
dc.identifier.wosquality | Q2 | |
dc.language.iso | en | en_US |
dc.publisher | Amer Chemical Soc | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | [No Keyword Available] | en_US |
dc.title | Near-Infrared Triggered Degradation for Transient Electronics | en_US |
dc.type | Article | en_US |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | 08c8db76-4ea9-4e56-abe5-99f86e51286d | |
relation.isAuthorOfPublication.latestForDiscovery | 08c8db76-4ea9-4e56-abe5-99f86e51286d |